Patissier program
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PATISSIER: software to estimate the smectite content and number of consecutive illite layers in mixed-layer illite-smectite using illite crystallinity data
The name "Patissier" means pastrycook in French. Because clay minerals can be considered as milfoil… Thus when we discussed about this with BERNARD KÜBLER, the father of the illite crystallinity, he found that very funny, and thus we kept this name.
Abstract:
Illite crystallinity is an efficient low-grade metamorphic indicator,
the value of which depends on several factors. Program NEWMOD allows one
to evaluate the dependence of IC for air-dried and ethylene-glycol treated
samples on the mean thickness (number of layers) of illite crystallites
(N), on swelling interlayer (smectite) content (%S) of illite, and with
ordering parameters that describe layer stacking. Using these relationships,
software "PATISSIER" allows the estimation in illite-smectite
of N, %S, and the number of consecutive illite layers. The latter corresponds
to the physical value hidden in IC that best describes metamorphic grade.
Software "PATISSIER" can use old data sets to reinterpret many existing measurements using the IC method, the so-called Kübler index.
Keywords:
Illite crystallinity, software, illite-smectite, mixed-layer, XRD.
In:
M. Jaboyedoff and P. Thélin (2002): PATISSIER: software to estimate
the smectite content and number of consecutive illite layers in mixed-layer
illite-smectite using illite crystallinity data. SCHWEIZ. MINERAL. PETROGR.
MITT. 82. (in press).
Downloads
Program
Patissier: Extract the zipfile in to temporary directory and run the
setup.exe. (Compiled on Windows 98SE, and tested on Windows
98 and XP home, must run under Windows 95, 98, ME, NT 4.0, 2000 and XP).
Program Patissier User guide:
Example files:
Illite Crystallinity values from: Kisch, H. J. and M. Frey (1987): Appendix: effect of sample preparation on the 10 Å peak of illite (illite 'crystallinity'). In: Frey, M. (ed): Low temperature metamorphism, Blackie, Glasgow, 301-304.
Example of instrumental correction file: For the characteristics of a Rigaku diffractmeter: